Kremniyda III-V binar birikmalarni shakillantirish shartlari.

Основное содержимое статьи

X.M. Iliyev
S.B. Isamov
B.O. Isakov
R. Sobirjonov
V. Sultonov

Аннотация

Yorug‘lik diodlari, lazerlar, tezkorligi yuqori bo‘lgan maydonli tranzirtorlar kabi elektron qurilmalar, samaradorligi yuqori bo‘lgan quyosh panellarini ishlab chiqishda asosiy material hisoblanadigan III-V binar birikmali yarimo‘tkazgichlarga bo‘lgan qiziqish tobora ortib bormoqda. Lekin III-V binar birimali yarimo‘tkazgichlar sanoatda hom ashyo sifatida noyob va qimmat material bo‘lganligi sababli, ularni kremniy kabi sanoatda hom ashyo sifatida ulkan zaxiraga ega va olinish texnologiyasi yaxshi o‘zlashtirilgan material asosida shakillantirish dolzarb masalalardan biridir. Shu munosabat bilan ushbu ishda kremniyda III-V binar birikmalarni shakillanish shartlari haqida so‘z yuritilgan.

Информация о статье

Как цитировать
X.M. Iliyev, S.B. Isamov, B.O. Isakov, R. Sobirjonov, & V. Sultonov. (2023). Kremniyda III-V binar birikmalarni shakillantirish shartlari. Конференция Ферганского государственного университета, 42. извлечено от https://conf.fdu.uz/index.php/conf/article/view/2292
Раздел
Физика

Библиографические ссылки

Yanlong Yin, Jiang Li, Yang Xu, Hon Ki Tsang, and Daoxin Dai. 2018 Journal of Semiconductors. 39 (6), 061009/1-8.

Wenyu Yang, Yajie Li, Fangyuan Meng, Hongyan Yu, Mengqi Wang, Pengfei Wang, Guangzhen Luo, Xuliang Zhou, and Jiaoqing Pan. 2019 Journal of Semiconductors 40 (101305), 1-9.

Levinshtein M., Rumyantsev S. and Shur M. 1996 Handbook series on semiconductor parameters. Volume 1. Pp 1-31.

Ahmed Ali Mohammad Monzur-Ul-Akhir, Masayuki Mori, and Koichi Maezawa. 2017 Phys. Status Solidi B. 254 (2) 1600528.

Monzur-Ul-Akhir A. A. Md., Masayuki Mori, and Koichi Maezawa. 2019 Japanese Journal of Applied Physics. 58 (SIIA17) 1-9.

X.M. Iliyev, S.B. Isamov, B.O. Isakov, U.X. Qurbonova, S.A. Abduraxmonov. A surface study of Si doped simultaneously with Ga and Sb. East Eur. J. Phys. (2023) 3, 303-307-b.

X.M. Iliyev, V.B. Odzhaev, S.B. Isamov, B.O. Isakov, B.K. Ismaylov, K.S. Ayupov, S.I. Hamrokulov, S.O. Khasanbaeva. X-ray diffraction and raman spectroscopy analyses of GaSb-enriched Si surface formed by applying diffusion doping technique. East Eur. J. Phys. (2023) 3, 363-369-b.

Siegfried Selberherr, Viktor Sverdlov. Strain-Induced Effects in Advanced MOSFETs // Computational Microelectronics, 2011, pp. 252.

Burcu Arpapay, Y Eren Suyolcu, Gülcan Çorapçıoglu, Peter A van Aken, Mehmet Ali Gülgün and Ugur Serincan. A comparative study on GaSb epilayers grown on nominal and vicinal Si(100) substrates by molecular beam epitaxy // Semicond. Sci. Technol. 36 (2020) 025011 (12pp)

Содиқов У.Х. Кремнийли фотоэлементларнинг спектрал сезгирлик соҳасини бинар элементар ячейкалар ёрдамида кенгайтириш // Физика – математика фанлари бўйича фалсафа доктори (PhD) ДИССЕРТАЦИЯ, 2019, c. 142.