J.YU.ROZIQOV; Q.Q.MUHAMMADAMINOV. QUALITY DETERIORATION FACTORS: TECHNOLOGICAL DRAWBACKS IN THE PRODUCTION OF SEMICONDUCTOR TENSORESISTORS AND SENSORS . Fergana state university conference, [S. l.], p. 76–80, 2024. Disponível em: https://conf.fdu.uz/index.php/conf/article/view/3099. Acesso em: 20 sep. 2024.